Water oxidation with holes: what we learn from operando "synchrotron" studies(Conference Presentation)

A. Braun
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Abstract

Photoelectron holes are key players in photoelectrochemical water oxidation. They provide the basis for direct solar fuel production in photoelectrochemical cells. Physics and chemistry in semiconductor photoelectrochemistry are probably the most complex known in physical chemistry. Therefore it is not surprising that the science of solar water splitting rests still on some speculative elements. Thanks to progress in synchrotron instrumentation, x-rays and electrons as probes for chemical and physical processes arenow used in complex experiments during device operation. The studies which were impossible until recently are spectacular. We show how we assess with x-ray based ligand and valence band NEXAFS and AP-XPS spectroscopy the density of hole states in photoelectrodes as a function of electrochemical parameters and at the same time find quantitative information on surface intermediates. We can resolve the interaction of the photoelectrode with the electrolyte down to the Fe3d and O2p orbitals with bias parametrized energetic and spatial depth resolution, including the charge carrier accumulation layer, the electrode surface and the Helmholtz layer. The x-ray electronic structure data are in full alignment with the charge carrier dynamics probed with electroanalytical methods. Noteworthy is that we verify and confirm a historically speculated second electron hole, which corresponds to a transition into the charge transfer band, which precedes the water splitting and coincides with the formation of a hydroxyl intermediate. Latter disappears when water oxidation sets on.
带孔的水氧化:我们从歌剧“同步加速器”研究中学到的东西(会议报告)
光电子空穴是光电化学水氧化的关键。它们为光电化学电池直接生产太阳能燃料提供了基础。半导体光电化学中的物理和化学可能是物理化学中最复杂的。因此,太阳水分解的科学仍然依赖于一些推测的元素,这并不奇怪。由于同步加速器仪器的进步,x射线和电子作为化学和物理过程的探针,现在在设备操作过程中用于复杂的实验。这些直到最近才被认为是不可能的研究是惊人的。我们展示了我们如何利用基于x射线的配体和价带NEXAFS和AP-XPS光谱来评估光电极中的空穴态密度作为电化学参数的函数,同时找到表面中间体的定量信息。我们可以用偏压参数化的能量和空间深度分辨率来解析光电极与电解质的相互作用,直至Fe3d和O2p轨道,包括载流子积累层、电极表面和亥姆霍兹层。x射线电子结构数据与电分析方法探测的载流子动力学完全一致。值得注意的是,我们验证并确认了历史上推测的第二个电子空穴,它对应于在水分裂之前进入电荷转移带的跃迁,并与羟基中间体的形成相吻合。当水氧化开始时,后者就消失了。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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