Capacitance: relationships and measurements (for multiple conductors in VLSI packages and PWB)

Abstract

Three descriptions of capacitances for multiple conductors over a ground are discussed: the lumped-element capacitance, the two-terminal capacitance, and Maxwell's capacitance. Equations that completely interrelate the different descriptions of capacitance are presented. Experimental evidence supporting the two-terminal measurement technique is presented. An example how the measurement can be applied to the VLSI package is given. It is also shown how networks of cross-coupled resistors can be measured.<>