Study of magnetic probes used in EMI measurements

Ming-Shing Lin, Cyuan-Min He, C. G. Hsu
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引用次数: 3

Abstract

In this study, four H-field probes having different feeding structures, including a strip line, a microstrip line, a coplanar waveguide (CPW), and a conductor-backed CPW (CB-CPW), were investigated and compared. The sensitivity, calibration factor, E-field isolation, and spatial resolution of the magnetic probes were calculated and evaluated. It was found that all these probes can be used to measure the near-field radiation from and the RF current in an IC pin or a trace on a printed-circuit board (PCB).
电磁干扰测量用磁探头的研究
在本研究中,研究并比较了四种不同馈电结构的h场探针,包括带线、微带线、共面波导(CPW)和导体背波导(CB-CPW)。计算并评价了磁探头的灵敏度、标定系数、电磁场隔离度和空间分辨率。结果表明,所有探头均可用于测量IC引脚或印刷电路板(PCB)上的近场辐射和射频电流。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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