Large-signal modeling of GaN devices with emphasis on trapping effect and thermal challenges (Invited)

Abstract

This paper will present the recent development of large-signal modeling cum PA design based on Dynax GaN HEMT devices. A modified Angelov model is used to model the pulse I-V data. Improved modeling results to address the trapping effect will be given together with new model parameter extraction methodology. The model is implemented in a commercial EDA tools for PA design simulation.