Multifunctional Equipment and Test Results for Total Ionizing Dose Testing of Analog Integrated Circuits

2016 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2016-07-11 DOI:10.1109/NSREC.2016.7891724

A. Bakerenkov, P. Chubunov, V. Anashin, A. Rodin, V. Felitsyn

引用次数: 1

Abstract

Multifunctional equipment for total ionizing dose testing of different functional types of analog integrated circuits and discrete transistors is developed and described. Corresponding test results for several types of analog devices are presented and discussed.

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模拟集成电路总电离剂量试验的多功能设备和试验结果

研制并描述了用于不同功能类型的模拟集成电路和分立晶体管的总电离剂量测试的多功能设备。给出并讨论了几种模拟器件的相应测试结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2016 IEEE Radiation Effects Data Workshop (REDW)

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