Modeling of Multilayer Thick Film Components Using Time Domain Techniques

Abstract

A technique for modeling multilayer thick film components using time domain measurements is presented. A multilayer inductor, formed by stacking spiral coils vertically with intervening dielectric layer, is used to demonstrate the technique. The component under test is placed at the end of a reference line, and a TDR waveform is acquired. A physically based model is developed to fit the TDR information.