A New Wideband, Low Insertion Loss SiGe Digital Step Attenuator A New Wideband, Low Insertion Loss SiGe Digital Step Attenuator

Clifford D. Y. Cheon, Moon-Kyu Cho, Sunil G. Rao, A. Cardoso, J. Connor, J. Cressler
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引用次数: 2

Abstract

This paper presents a new, wideband digital step attenuator (DSA) implemented using SiGe HBTs. The vertical profile of the SiGe HBT presents small parasitic shunt capacitance and, thus, the loss from the switches in a switched-type attenuator is significantly reduced. For a 6-bit DSA covering a maximum attenuation of 31.5 dB with 0.5 dB steps, reduced T-type cells with reverse-saturated SiGe HBTs are used for low attenuation cells and switched pi-type cells with novel anti-parallel (AP) SiGe HBT pair series switches are used for high attenuation cells. In addition to the symmetry of the AP SiGe HBT pair, reduced T-type and switched pi-type cells are placed alternately to distribute parasitic components and to achieve better overall symmetry. As a result, state-of-the-art performance is achieved over a wide bandwidth, from DC-to-60 GHz, with an insertion loss of 7.5 dB at 50 GHz, 31.5 dB of attenuation range and less than 2.8 mW of power consumption.
一种新型宽带、低插入损耗SiGe数字阶跃衰减器
本文提出了一种利用SiGe hbt实现的新型宽带数字阶跃衰减器(DSA)。SiGe HBT的垂直轮廓呈现小的寄生并联电容,因此,开关型衰减器中的开关损耗显着降低。对于以0.5 dB阶跃覆盖31.5 dB最大衰减的6位DSA,低衰减单元使用具有反向饱和SiGe HBT的减小t型单元,高衰减单元使用具有新型反并行(AP) SiGe HBT对系列开关的开关pi型单元。除了AP SiGe HBT对的对称性外,简化t型和开关pi型电池交替放置以分布寄生成分并获得更好的整体对称性。因此,在从dc到60 GHz的宽带宽范围内实现了最先进的性能,在50 GHz时插入损耗为7.5 dB,衰减范围为31.5 dB,功耗低于2.8 mW。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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