Techniques for modulating error resilience in emerging multi-value technologies

Abstract

There exist extensive ongoing research efforts on emerging atomic scale technologies that have the potential to become an alternative to today's CMOS technologies. A common feature among the investigated technologies is that of multi-value devices, in particular, the possibility of implementing quaternary logic and memory. However, multi-value devices tend to be more sensitive to interferences and, thus, have reduced error resilience. We present an architecture based on multi-value devices where we can trade energy efficiency against error resilience. Important data are encoded in a more robust binary format while error tolerant data is encoded in a quaternary format. We show for eight benchmarks an average energy reduction of 14%, 20%, and 32% for the register file, level-one data cache, and main memory, respectively, and for three integer benchmarks, an energy reduction for arithmetic operations of up to 28%. We also show that for a quaternary technology to be viable a raw bit error rate of one error in 100 million or better is required.