Simple optical interferometer for measuring phase changes smaller than 10−5 Å

L. Weber
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Abstract

To measure subangstrom phase changes in the ac plasma display panel, the Jamin interferometer shown in Fig. 1 was used. The system features a double detector differential amplifier arrangement that balances out to the shot noise limit the amplitude variations from the laser. A servo system rotates a glass plate to compensate for low frequency vibrations and thermal variations. The optical flats have beam splitters that cause nearly 100% of the laser power to fall on the detectors, thus increasing SNR. A lens focuses the beam to give diffraction-limited spatial resolution in the region of the plasma cell.
用于测量小于10−5的相位变化的简单光学干涉仪Å
为了测量交流等离子体显示面板的亚埃相位变化,使用了如图1所示的Jamin干涉仪。该系统的特点是采用双探测器差分放大器布置,平衡了射散噪声,限制了激光的振幅变化。伺服系统旋转玻璃板以补偿低频振动和热变化。光学平台下有分束器,使几乎100%的激光功率落在探测器上,从而增加了信噪比。透镜聚焦光束以在浆细胞区域内提供衍射限制的空间分辨率。
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