RBS analysis of Au/Cr contact on GaAs

D. Pantelica, G. Drafta, C. Borcan, D. Diaconescu, M. Buda, R. Ghiţă
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Abstract

This paper investigates the mass transport in Au/Cr contacts deposited on GaAs. Such contacts are commonly used as ohmic contacts on p-type GaAs. For characterisation we used the RBS technique, replacing the classical /spl alpha/ particles with /sup 7/Li ions. This allows a great improvement in depth and mass resolution.
砷化镓上Au/Cr接触的RBS分析
本文研究了沉积在砷化镓上的Au/Cr触点的质量输运。这种触点通常用作p型砷化镓上的欧姆触点。为了进行表征,我们使用了RBS技术,将经典的/spl α /粒子替换为/sup 7/Li离子。这使得深度和质量分辨率有了很大的提高。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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