Sulfur passivation for photosensitivity control of detectors with corrugated metal-III-V semiconductor interface

Abstract

We report on a sulfur based surface passivation method for photosensitivity control of MSM detectors with corrugated interface. Spectral and polarization characteristics of photosensitivity are used to study this treatment effectiveness. The investigation results reveal that the photosensitivity of diodes increases up to a one order of magnitude. Such characteristics were monitored over a period of 3 years and were found to be stable. The spectral sensitivity of prepared photodetectors in the surface plasmon polariton excitation regime after S-treatment is tunable over the visible spectrum by a dielectric coating.