Switch cell optimization of power-gated modern system-on-chips

Dongyoun Yi, Taewhan Kim
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引用次数: 1

Abstract

This work addresses a practical problem of allocating and placing a minimal number of active switch cells in power gated modern System-on-Chips (SoCs) to save the unnecessary standby leakage under noise (i.e., IR-drop) constraint. Since power gating switch cells are physically directly connected to power rails, their overall allocation structure is synthesized in a stage before the logic cell placement. Consequently, the allocation of switch cells in the pre-placement could lead to unnecessarily high standby leakage for modern designs. This work proposes a practical remedy for this problem at the post-placement stage. Specifically, for an initial design with a grid-based switch cell allocation, which is commonly used design methodology in industry, we propose a comprehensive solution to determining, for each switch cell, (1) whether the cell can be permanently turned off or (2) the type of switch cell for replacement so that the resulting total standby leakage of switch cells should be minimized under the noise constraint. We formulate the problem into a variant of weighted set cover problem and solve it efficiently by employing an approximate set cover algorithm. Through experiments with benchmark circuits in ISCAS89, OPENMSP430, and FPU, it is shown that our method is able to reduce the standby leakage by 35.0% and 13.9% over the initial designs and the designs produced by the previous switch cell optimization method in [5], respectively.
电源门控现代片上系统的开关单元优化
这项工作解决了一个实际问题,即在功率门控的现代片上系统(soc)中分配和放置最少数量的有源开关单元,以节省噪声(即ir下降)约束下不必要的待机泄漏。由于电源门控开关单元在物理上直接连接到电源轨道,因此在逻辑单元放置之前的一个阶段合成了它们的总体分配结构。因此,在预放置开关单元的分配可能导致不必要的高待机泄漏为现代设计。这项工作提出了在安置后阶段对这个问题的实际补救措施。具体来说,对于基于网格的开关单元分配的初始设计,这是工业中常用的设计方法,我们提出了一个全面的解决方案来确定,对于每个开关单元,(1)电池是否可以永久关闭或(2)更换开关单元的类型,以便在噪声约束下最小化开关单元的总备用泄漏。将该问题转化为加权集覆盖问题的一个变体,并采用近似集覆盖算法有效地求解了该问题。通过ISCAS89、OPENMSP430和FPU的基准电路实验表明,我们的方法能够比初始设计和先前[5]中的开关单元优化方法产生的设计分别减少35.0%和13.9%的待机泄漏。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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