Creating automated test and repair solutions with advanced diagnostics and ATE software

M. Dewey, J. Lauffer
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引用次数: 1

Abstract

Today's complex electronic assemblies employ sophisticated and advanced automated test solutions to verify functional performance - both at the time of manufacture and for depot repair scenarios. Providing go / no-go test solutions are routinely created for all types of electronic assemblies. However, the task of diagnosing today's failed UUTs or systems is not a process that is easily automated. Older generation and less complex electronic assemblies may have employed automated diagnostics such as guided probe but with the complexity of today's electronic assemblies, coupled with long program development time, automated diagnostics has largely been abandoned by OEMs and Depot test / repair facilities. However, with products becoming increasingly complex and with the extended life-cycles of many mil-aero and commercial systems and platforms, the need for automated diagnostics remains in high demand, and this demand continues to increase - particularly at the Depot level where the ability to efficiently and accurately diagnose and repair products is acute. This paper discusses how advances in diagnostic tools can be incorporated with ATE software to create a comprehensive test environment supporting, go / no-go, as well as automated diagnostics. By integrating the diagnostics design knowledge with the test station, test confidence is taken to the highest level and, in the event of a UUT failure, rapid identification of the failed component is now embedded in the test station. Today's high tech test systems provide excellent confidence testing; however, the extended time required to troubleshoot and analyze a faulty UUT complicates support logistics and drives up over all support / maintenance and Unit Production Costs (UPC). Repairing today's complex UUTs requires a high skill level to isolate the failure to the root cause component. By employing an advanced UUT diagnostics design methodology which provides an enhanced understanding of the unit's test capability, coupled with the design knowledge of the UUT, the capabilities of an existing test station can be extended to included advanced diagnostics.
使用先进的诊断和ATE软件创建自动化测试和修复解决方案
当今复杂的电子组件采用复杂和先进的自动化测试解决方案来验证功能性能-无论是在制造时还是在维修场景中。为所有类型的电子组件提供正常/不正常测试解决方案。然而,诊断当今失败的utu或系统的任务并不是一个容易自动化的过程。老一代和不太复杂的电子组件可能采用自动诊断,如引导探针,但随着当今电子组件的复杂性,加上程序开发时间长,自动诊断在很大程度上已被原始设备制造商和仓库测试/维修设施所放弃。然而,随着产品变得越来越复杂,随着许多军用航空和商用系统和平台的生命周期延长,对自动诊断的需求仍然很高,而且这种需求还在继续增加——特别是在仓库层面,高效、准确地诊断和维修产品的能力是迫切的。本文讨论了如何将先进的诊断工具与ATE软件结合起来,以创建一个全面的测试环境,支持go / no-go以及自动诊断。通过将诊断设计知识与测试站集成,测试置信度达到最高水平,并且在UUT故障的情况下,故障组件的快速识别现在嵌入到测试站中。今天的高科技测试系统提供了出色的信心测试;然而,排除故障和分析故障UUT所需的延长时间使支持后勤复杂化,并推高了所有支持/维护和单位生产成本(UPC)。修复当今复杂的uut需要高水平的技能来将故障隔离到根本原因组件。通过采用先进的UUT诊断设计方法,可以增强对单元测试能力的理解,再加上UUT的设计知识,现有测试站的能力可以扩展到包括高级诊断。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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