Determination of subband energy levels of double quantum well AlGaAs lasers by photoreflectance and self-excited electron Raman scattering

W. Susaki, S. Ukawa, N. Ohno, H. Takeuchi, Y. Yamamoto, R. Hattori, A. Shima, Y. Mihashi
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Abstract

In this paper, subband energy levels of an AlGaAs separate-confinement-hetrostructure (SCH) double quantum well (DQW) layer are determined by photoreflectance (PR) and compared with those determined by the self-excited ERS of lasers fabricated from the same DQW structure but with different waveguide thickness. Subband energy levels determined by both measurements are in a good agreement.
双量子阱AlGaAs激光器子带能级的光反射和自激电子拉曼散射测定
本文利用光反射率(PR)测定了AlGaAs分离-束缚-异质结构(SCH)双量子阱(DQW)层的子带能级,并与采用相同DQW结构但不同波导厚度的激光器的自激ERS测定的子带能级进行了比较。两种测量方法确定的子带能级非常一致。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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