Infrared Characterization and Electrochemical Study of Silanes Grafted into Surface of Copper

Abstract

The formation of a protective layer of tow silane coupling agents: γ -methacryloxypropyltrimethoxysilane (γ-MPS) or γ-aminopropyltriethoxysilane (γ-APS) on copper is studied by diffuse reflectance infrared spectroscopy (DRIFT), electrochemical (Potentiodynamic polarization) and gravimetric chemical (Weight loss) measurements. Dried in ambient conditions, the silane adsorbed on the copper subtract physically, however its protective action is not reliable. Thiolate and siloxane band formation ameliorate the protective action of the silanic layer on the surface of copper especially after curing process. Potentiodynamic polarization and Weight loss experiments show that the performances protective action of cured treatment (cured/Cu-silane) is higher than that of aging process (aged/Cu-silane).