A strong arbiter PUF using resistive RAM within 1T-1R memory architecture

Rekha Govindaraj, Swaroop Ghosh
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引用次数: 8

Abstract

Physically Unclonable Function (PUF) is cost effective and reliable security primitives widely used in authentication and in-place secret key generation. With growing research in the area of non-CMOS technologies for memories and circuits, it is important to understand their implications on the design of security primitives. Resistive Random Accessible Memory (RRAM) offers easy integration with CMOS due to minimal changes in the process technology. RRAM also demonstrates resistance variability characteristics due to inherent defects in the conducting filament formed inside the metal oxide layer. RRAM based PUF designs exploit either the probabilistic switching of RRAM or the resistance variability during forming, SET and RESET processes. Memory PUFs using RRAM are typically weak PUFs due to fewer number of Challenge Response Pairs (CRPs). We propose strong arbiter PUF based on 1T-1R bit cell which is obtained from conventional RRAM memory array with minimally invasive changes. Conventional voltage sense amplifier is employed to generate the response. The PUF is simulated using 65nm predictive technology models for CMOS and Verilog-A model for a hafnium oxide based RRAM. The proposed PUF architecture is evaluated for uniqueness, uniformity and reliability and by running NIST benchmarks. It demonstrates mean intra-die Hamming Distance (HD) of 0.13% and inter-die HD of 51.3%, and, passes the NIST tests.
在1T-1R存储器架构中使用电阻性RAM的强大仲裁器PUF
物理不可克隆函数(physical unclable Function, PUF)是一种经济可靠的安全原语,广泛用于身份验证和就地密钥生成。随着非cmos技术在存储器和电路领域的研究不断增长,了解它们对安全原语设计的影响是很重要的。电阻式随机存取存储器(RRAM)由于工艺技术的最小变化而易于与CMOS集成。由于在金属氧化物层内形成的导电丝的固有缺陷,RRAM还表现出电阻可变性特性。基于RRAM的PUF设计要么利用RRAM的概率开关,要么利用成形、SET和RESET过程中的电阻变异性。使用RRAM的内存puf通常是弱puf,因为它们的挑战响应对(CRPs)数量较少。我们提出了基于1T-1R位单元的强仲裁PUF,该单元是由传统的RRAM存储器阵列获得的,具有微创改变。采用传统的电压检测放大器产生响应。PUF采用65纳米CMOS预测技术模型和基于氧化铪的RRAM Verilog-A模型进行模拟。通过运行NIST基准测试,评估了所建议的PUF体系结构的唯一性、一致性和可靠性。该算法的平均模内汉明距离(HD)为0.13%,模间汉明距离(HD)为51.3%,通过了NIST测试。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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