28nm Data Memory with Embedded RRAM Technology in Automotive Microcontrollers

Alessandro Grossi, M. Coppetta, S. Aresu, A. Kux, T. Kern, R. Strenz
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Abstract

We present features adding extra reliability margin for emerging Non-Volatile Memories adoption in automotive microcontrollers, and discuss experimental data of embedded 28nm RRAM Data Memory on high statistics from a microcontroller demonstrator. The results reported show that 28nm embedded RRAM reached an adequate maturity and is ready for replacement of embedded Flash in automotive applications.
基于嵌入式RRAM技术的28nm数据存储器应用于汽车微控制器
我们介绍了在汽车微控制器中采用新兴非易失性存储器增加额外可靠性裕度的特性,并讨论了嵌入式28nm RRAM数据存储器在微控制器演示器的高统计数据上的实验数据。结果表明,28nm嵌入式RRAM已经足够成熟,可以在汽车应用中取代嵌入式闪存。
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