15.8 A 4.5V/ns Active Slew-Rate-Controlling Gate Driver with Robust Discrete-Time Feedback Technique for 600V Superjunction MOSFETs

S. Kawai, T. Ueno, Kohei Onizuka
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引用次数: 10

Abstract

Active gate control is an emerging technique to minimize the switching loss of high-power converters facing noise-suppression challenges. In a conventional gate-driver design, a fixed value of gate resistance is chosen by the converter designers so that the slew rate (SR) of the drain voltage Vd, namely $dV_{d}/$dt, does not exceed noise-aware design guidelines in each application and use case. Minimizing the gate resistance leads to high $dV_{d}/$dt and the reduction in switching loss while shortening the turn-on delay for the overall converter performance. However, the impact is limited because of uncontrollable $dV_{d}/$dt drift caused by load-current, temperature, and $\mathrm {V}_{th}$ variations of the power transistors. Thus, in practice there is significant room for further loss and turn-on-delay minimization for the active gate control that adaptively modulates gate driving ability within every switching cycle.
15.8用于600V超结mosfet的具有鲁棒离散时间反馈技术的4.5V/ns有源螺杆速率控制栅极驱动器
有源栅极控制是一种新兴的技术,可以最大限度地降低大功率变换器在噪声抑制方面的开关损耗。在传统的栅极驱动器设计中,变换器设计人员选择一个固定的栅极电阻值,以便漏极电压Vd的压转率(SR),即$dV_{d}/$dt,在每个应用和用例中不超过噪声感知设计准则。最小化栅极电阻可以获得较高的$dV_{d}/$dt,降低开关损耗,同时缩短导通延迟,从而提高变换器的整体性能。然而,由于负载电流、温度和功率晶体管的数学{V} {th}$变化引起的不可控的$dV_{d}/$dt漂移,影响是有限的。因此,在实践中,对于在每个开关周期内自适应调节栅极驱动能力的有源栅极控制,存在进一步减小损耗和导通延迟的显著空间。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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