{"title":"15.8 A 4.5V/ns Active Slew-Rate-Controlling Gate Driver with Robust Discrete-Time Feedback Technique for 600V Superjunction MOSFETs","authors":"S. Kawai, T. Ueno, Kohei Onizuka","doi":"10.1109/ISSCC.2019.8662534","DOIUrl":null,"url":null,"abstract":"Active gate control is an emerging technique to minimize the switching loss of high-power converters facing noise-suppression challenges. In a conventional gate-driver design, a fixed value of gate resistance is chosen by the converter designers so that the slew rate (SR) of the drain voltage Vd, namely $dV_{d}/$dt, does not exceed noise-aware design guidelines in each application and use case. Minimizing the gate resistance leads to high $dV_{d}/$dt and the reduction in switching loss while shortening the turn-on delay for the overall converter performance. However, the impact is limited because of uncontrollable $dV_{d}/$dt drift caused by load-current, temperature, and $\\mathrm {V}_{th}$ variations of the power transistors. Thus, in practice there is significant room for further loss and turn-on-delay minimization for the active gate control that adaptively modulates gate driving ability within every switching cycle.","PeriodicalId":265551,"journal":{"name":"2019 IEEE International Solid- State Circuits Conference - (ISSCC)","volume":"65 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE International Solid- State Circuits Conference - (ISSCC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.2019.8662534","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10
Abstract
Active gate control is an emerging technique to minimize the switching loss of high-power converters facing noise-suppression challenges. In a conventional gate-driver design, a fixed value of gate resistance is chosen by the converter designers so that the slew rate (SR) of the drain voltage Vd, namely $dV_{d}/$dt, does not exceed noise-aware design guidelines in each application and use case. Minimizing the gate resistance leads to high $dV_{d}/$dt and the reduction in switching loss while shortening the turn-on delay for the overall converter performance. However, the impact is limited because of uncontrollable $dV_{d}/$dt drift caused by load-current, temperature, and $\mathrm {V}_{th}$ variations of the power transistors. Thus, in practice there is significant room for further loss and turn-on-delay minimization for the active gate control that adaptively modulates gate driving ability within every switching cycle.