Proposal for Precision Prediction Method for Depth Measuring Microscope Using Grating Projection Method

K. Kaneko, M. Fujigaki, Y. Murata
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Abstract

The purpose of this study is to propose predictive method of the measuring precision of the depth measuring microscope using a technique that combines a whole-space tabulation method (WSTM) and light-source stepping method. The WSTM excludes almost all of systematic errors such as the influence of a lens distortion and deformation of the brightness distribution of the projected grating from the measured result. Therefore, it becomes possible to predict the precision of a measurement device by only considering the random error caused by camera noise and caused by reflectance characteristics of the surface of an object. In this study, a precision prediction method for depth measuring microscope using grating projection method is proposed. The effectiveness of the predictive method is verified by comparing the predicted precision and the measuring precision. The theory and experimental results are shown.
光栅投影法深度测量显微镜精度预测方法的提出
本研究的目的是利用全空间制表法(WSTM)和光源步进法相结合的技术,提出深度测量显微镜测量精度的预测方法。WSTM从测量结果中排除了几乎所有的系统误差,如透镜畸变和投影光栅亮度分布变形的影响。因此,仅考虑相机噪声引起的随机误差和物体表面反射特性引起的随机误差,就可以预测测量装置的精度。本文提出了一种基于光栅投影法的深度测量显微镜精度预测方法。通过对预测精度和测量精度的比较,验证了该预测方法的有效性。给出了理论和实验结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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