X-Ray Diffraction Method forDetermination of Texture Evolution inLayers

Abstract

An X-ray diffraction method for the determination of texture evolution in electrodeposited and vapour-deposited layers was developed. It was applied to the study of the texture of electrodeposited bright zinc. It was established that the arising of texture in the concrete models is due to oriented nucleation as well as to a growth selection process. The substrate structure also has an effect on the character of the texture evolution.