The multi-configuration: A DFT technique for analog circuits

Abstract

A Design-For-Testability (DFT) technique for analog circuits, called the Multi-Configuration technique is presented. This technique exhibits some flexibility features since different solutions are possible for its implementation. Different degrees of granularity are associated to the different solutions, corresponding to a given trade-off between implementation cost and test and/or diagnosis facilities. The multi-configuration technique is illustrated and validated on a 8/sup th/ order band pass filter.