A Novel Approach for Measurement Throughput Maximization in FPGA-based TDCs

Abstract

This paper presents a new approach for dead-time minimization while preserving low resource usage and high resolution in FPGA-based time-to-digital (TDC) converters. The proposed TDC architecture can be employed in applications in which many events need to be detected in a short time, such as time-of-flight positron emission tomography (ToF-PET) applications. The presented architecture consists of a toggling input stage, a tapped delay line (TDL), a dual-mode counter-based encoder, a coarse counter, and a bin width calibration stage. The minimum dead-time of TDL TDCs is two clock cycles. The proposed architecture reduced dead-time to one clock cycle. The measurement results of the proposed low-resources TDC in an Artix-7 FPGA show [-0.80, 1.34] LSB differential nonlinearity (DNL) and [-0.73, 1.97] LSB integral non-linearity (INL). The measured LSB size and single-shot precision (SSP) are 22.1 ps and 28.43 ps, respectively.