White-Light Continuum Spectral Interferometry for Dispersion Characteristics Measurements in Anisotropic Crystals

Abstract

White-light spectral interferometry has been recently demonstrated to allow a very precise determination of dispersion [1, 2]. In usual isotropic materials (glass), the use of a correct dispersion rule (Sellmeier or Cauchy formula for instance) in a nonlinear fitting procedure can lead to an enhanced accuracy (of the order of 10−5) for the indices.