Towards a method for combined model-based testing and analysis

Abstract

Efficient and effective verification and validation of complex embedded systems is challenging, and requires the use of various tools and techniques, such as model-based testing and analysis. The aim of this paper is to devise an overall method for how analysis and testing may be used in combination to increase the quality of embedded systems, and reduce development cost. The method is centered on a common verification planning and iteratively exploiting the established results to strengthen the verification activities. We conclude that the proposed method is general enough to capture most interesting combinations and workflows, but also that formulation of more specific combination patterns will be useful to encourage future tool collaborations.