The single-event-effect behaviour of commercial-off-the-shelf memory devices. A decade in low-Earth orbit

C. Underwood
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引用次数: 6

Abstract

This paper presents the results of a 10-year study on radiation effects in commercial-off-the-shelf (COTS) memory devices operating within the on-board data handling systems of five low-Earth orbiting micro-satellites, designed and built at the University of Surrey (UoS). The ionising particle environment inside three of these spacecraft has been investigated concurrently using radiation monitoring payloads developed by UoS and the Defence Evaluation and Research Agency (DERA). Through the use of these monitoring instruments, and an allied programme of ground-based testing of the memory devices, the industry-standard computer models of the radiation environment have been verified, and the memory device behaviour has characterised with respect to single-event (SEEs) due to galactic cosmic-rays, geomagnetically trapped particles, and solar particles.
商用现成存储器的单事件效应行为。在近地轨道上待了十年
本文介绍了在萨里大学(UoS)设计和建造的五颗低地球轨道微型卫星的机载数据处理系统中运行的商用现货(COTS)存储设备的辐射效应的10年研究结果。其中三艘航天器内的电离粒子环境已经同时使用由UoS和国防评估与研究局(DERA)开发的辐射监测有效载荷进行了调查。通过使用这些监测仪器,以及对存储设备进行地面测试的联合计划,已经验证了辐射环境的工业标准计算机模型,并且存储设备的行为具有由银河系宇宙射线、地磁捕获粒子和太阳粒子引起的单事件(SEEs)的特征。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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