{"title":"Modelling of process and reliability of press-fit interconnections","authors":"T. Fellner, E. Zukowski, J. Wilde","doi":"10.1109/ESIME.2009.4938502","DOIUrl":null,"url":null,"abstract":"This investigation is aimed at the stability of press-fit interconnections for MID. Moulded Interconnect Devices (MID) are 3-dimensional substrates produced by thermoplastic injection moulding for large-series applications. The assembly process of press-fit interconnections has been correctly modelled with a FE-Software. With this model the behaviour of the mechanical contact pressure, which decreases due to creep in the thermoplastic base material, could be described. Especially, the modelling is a tool to optimize pin and hole geometries. In order to obtain realistic results, the creep law parameters for the applied base material, a liquid-crystal polymer (LCP), was fitted to experimental. The required coefficients of friction were determined by adapting the simulations to the experiments. The time-dependent retention force between a pin and the substrate directly after assembly or after temperature loads could be predicted with finite element analyses, which was used as reliability criterion.","PeriodicalId":225582,"journal":{"name":"EuroSimE 2009 - 10th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems","volume":"27 4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-04-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"EuroSimE 2009 - 10th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESIME.2009.4938502","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
This investigation is aimed at the stability of press-fit interconnections for MID. Moulded Interconnect Devices (MID) are 3-dimensional substrates produced by thermoplastic injection moulding for large-series applications. The assembly process of press-fit interconnections has been correctly modelled with a FE-Software. With this model the behaviour of the mechanical contact pressure, which decreases due to creep in the thermoplastic base material, could be described. Especially, the modelling is a tool to optimize pin and hole geometries. In order to obtain realistic results, the creep law parameters for the applied base material, a liquid-crystal polymer (LCP), was fitted to experimental. The required coefficients of friction were determined by adapting the simulations to the experiments. The time-dependent retention force between a pin and the substrate directly after assembly or after temperature loads could be predicted with finite element analyses, which was used as reliability criterion.