Two-Parameter Model for SEE Rate Estimation

Abstract

The applicability of the IRPP method of SER estimation is limited for modern CMOS devices due to a number of issues. In the paper we propose a new approach to SER estimation that requires no additional information about the device other than experimental cross-section curves and can serve as a replacement for the IRPP method. The proposed approach is based on diffusion approximation of the charge collection from a particle track. The developed cross-section model contains only two parameters determined from test data. The same values of parameters are used to predict SEE cross-section in isotropic particle field., thus., enabling a simple approach to SER estimation in real operating conditions.