X-ray backlighting of the initial stage of single-wire and multi-wire Z-pinch

Xinlei Zhu, Ran Zhang, Haiyun Luo, Shen Zhao, X. Zou, Xinxin Wang
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引用次数: 3

Abstract

The initial stage of single-wire and multi-wire Z-pinch were investigated by X-ray backlighting using an X-pinch as the soft X-ray source. The experiments were carried out on the pulsed power generator PPG-I (400kA/500kV/100ns) which was designed and constructed by Tsinghua University. The source X-pinch and object single-wire or multi-wire Z-pinch are installed in the place of a current-return rod or the center between the anode and the cathode, respectively. The X-ray films with high resolution and high sensitivity were used to record the results. A resistive current probe and a Rogowski coil were used to monitor the current, and a step wedge filter was designed to measure the mass ablation rate of the thin wire. By a large number of imaging experiments, the time sequence of images for the coronal plasma formation, the inter-wire plasma merging, and the development of plasma instabilities of Z-pinch as well as some important quantitative parameters like mass ablation rate and core expansion rate were obtained.
x射线背光初期的单线和多线z夹紧
采用软x射线源,采用X-pinch技术对单线和多线Z-pinch的初始阶段进行了研究。实验在清华大学自行设计制造的脉冲功率发生器PPG-I (400kA/500kV/100ns)上进行。源端x -夹头和目标端单线或多线z -夹头分别安装在回流棒的位置或阳极和阴极之间的中心位置。采用高分辨率、高灵敏度的x射线胶片记录实验结果。采用电阻式电流探头和Rogowski线圈监测电流,设计了阶跃楔形滤波器测量细导线的质量烧蚀率。通过大量的成像实验,获得了冕状等离子体形成、线间等离子体合并、z箍缩等离子体不稳定性发展的时间序列以及质量烧蚀率、核心膨胀率等重要定量参数。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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