Johannes Maximilian Kühn, Akram Ben Ahmed, Hayate Okuhara, H. Amano, O. Bringmann, W. Rosenstiel
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引用次数: 5
Abstract
The partitioning, implementation and in-silicon leakage evaluation of MuCCRA4-BB proved the feasibility and validity of fine-grained BB. Furthermore, it demonstrated the superiority over coarse- and chip-grained BB, minimizing FBB leakage penalty and allowing far more RBB usage in all applications and scenarios. As leakage exacerbates in smaller geometries, fine-grained BB might be an answer with sensible overhead.