Analysis of double layered frequency selective surface based on WCIP-SM technique

Abstract

In this paper a technique combining the wave concept iterative method WCIP and the scattering matrix SM method is used to analyze a double screen rectangular conducting patches FSS structure, the WCIP method is used to obtain the scattering characteristics of the two FSS then the scattering matrix technique is applied to obtain the total scattering characteristics of the two level FSS structure. The WCIP-SM results are successfully compared with numerical and experimental results presented in literature.