Assessing the reliability of electrical insulating materials using accelerated aging tests

Abstract

The paper summarizes the theoretical background of the accelerated aging test method of electrical insulating materials and its reliability by using the Arrhenius approach. Arrhenius equation presents generally accepted practice for assessing reliability, life-time, and degree of decomposition of a material. By demonstrating a typical aging experiment in electrical engineering, the paper explains the test design, selection method, and proof of the testing concept for measuring activation energy in practice. On the base of measured activation energy, the paper further deals with the evaluation of obtained data and their suitability for use in the Arrhenius equation. Moreover, the paper also observes the temperature dependence of different interaction rates among chemical reactions and its influence on the material during the thermal decomposition.