A reliable 40 GHz opto-electrical system for characterization of frequency response of Ge PIN photo detectors

2014 7th International Silicon-Germanium Technology and Device Meeting (ISTDM) Pub Date : 2014-06-02 DOI:10.1109/ISTDM.2014.6874649

Wogong Zhang, Kaiheng Ye, S. Bechler, K. Ulbricht, M. Oehme, E. Kasper, J. Schulze

引用次数: 0

Abstract

This study presents calibration of a self-built 40 GHz measurement setup using vector network analyzer and Mach-Zehnder modulator. The setup is used for frequency response characterization of Ge PIN photodetectors.

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一种可靠的40 GHz光电系统用于Ge PIN光电探测器的频率响应表征

本文介绍了利用矢量网络分析仪和马赫-曾德调制器对自建的40ghz测量装置进行校准。该装置用于锗PIN光电探测器的频率响应表征。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2014 7th International Silicon-Germanium Technology and Device Meeting (ISTDM)

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