Analysis of temperature effect on electromagnetic susceptibility of microcontroller

Abstract

This paper presents a study about temperature effect on the conducted susceptibility level of a microcontroller. Based on direct power injection, the electromagnetic susceptibility of microcontroller is measured under different temperatures. Measurement results show that different temperature conditions could result in fluctuations of conducted susceptibility level. To analyze the temperature effect on susceptibility level, several potential threats in passive part, microcontroller input/output buffer and clock signal are presented in this paper.