Photovoltaic effect in ultra-thin a-Si/SiO2 multilayered structures

A. A. Shatveryan, A. Anopchenko, S. M. Hossain, A. Marconi, M. Wang, G. Pucker, P. Bellutti, Lorenzo Pavesi
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Abstract

Photovoltaic and photoconductive properties of ultra-thin a-Si/SiO2 multilayers grown by PECVD and annealed at 1150degC were studied. A quantum yield greater than one is observed due to secondary carrier generation from interface trap states.
超薄a-Si/SiO2多层结构中的光伏效应
研究了PECVD生长并在1150℃下退火的超薄a-Si/SiO2多层膜的光伏和光导性能。由于从界面阱态产生二次载流子,可以观察到大于1的量子产率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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