RAM diagnostic tests

IEEE International Workshop on Memory Technology, Design and Testing, Pub Date : 1996-08-13 DOI:10.1109/MTDT.1996.782499

V. Yarmolik, Y. Klimets, A. van de Goor, S. Demidenko

引用次数: 30

Abstract

In this paper the following problems are considered : 1) march test's diagnostic capability estimation, ie. the type of the fault and it's location; 2) advanced march tests with diagnostic ability; 3) a march test with the same fault coverage as test March C and optimal diagnostic ability.

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RAM诊断测试

本文主要研究了以下几个问题:1)行军试验的诊断能力估计，即行军试验的诊断能力估计。故障的类型和位置;2)具有诊断能力的高级行军试验;3)与测试三月C具有相同故障覆盖率和最优诊断能力的三月测试。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

IEEE International Workshop on Memory Technology, Design and Testing,

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