Mechanism analysis on hydrophobicity decrease of operating silicone rubber insulators

2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2006-10-01 DOI:10.1109/CEIDP.2006.311948

Xingquan Huang, Linjie Zhao, Chengrong Li, Shuqi Zhang, Jisha Yao, Jun Xiong, Wei Song

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引用次数: 1

Abstract

Through a series of on-site hydrophobicity-measuring tests for the silicone rubber insulators operated in Henan electric power grid of China, some insulators were found having the bad hydrophobicity performance. The objective of this paper is focused on the mechanism analysis of the hydrophobicity decrease of these insulators through a series of laboratory tests. As a comparison, some new samples were also investigated. Firstly, the hydrophobicity of the tested insulators was measured using the HC method before and after washing the contamination layer away. In addition, the scanning electron microscopy (SEM) and the attenuated total reflection infrared spectroscopy (ATR-FTIR) were also used to analyze the effect of aging on the hydrophobicity of the operating insulators. The test results show that the difference of the hydrophobicity performance of silicone rubber materials between the operated insulators and the new ones is negligible. The contamination deposition is the main factors causing the surface hydrophobicity decrease of these operating insulators. Some aging phenomena were found through SEM and ATR-FTIR tests. But the relationship between these aging phenomena and the hydrophocity decrease of the operated insulators was not found.

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运行中硅橡胶绝缘子疏水性下降的机理分析

通过对中国河南电网运行的硅橡胶绝缘子的一系列现场疏水测试，发现部分绝缘子的疏水性能较差。本文通过一系列的室内试验，对这些绝缘子疏水性下降的机理进行了分析。作为比较，还调查了一些新的样品。首先，用HC法测定了洗去污染层前后绝缘子的疏水性。此外，还利用扫描电镜(SEM)和衰减全反射红外光谱(ATR-FTIR)分析了老化对绝缘子疏水性的影响。试验结果表明，运行绝缘子与新绝缘子之间硅橡胶材料的疏水性能差异可以忽略不计。污染沉积是导致绝缘子表面疏水性下降的主要原因。通过SEM和ATR-FTIR测试发现了一些老化现象。但这些老化现象与运行绝缘子疏水性降低之间的关系尚不清楚。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena

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