{"title":"Discussion on the performances of hybrid SET-MOSFET Voltage Controlled Oscillators","authors":"W. Xuan, F. Calmon, N. Baboux, A. Souifi","doi":"10.1109/ICECS.2009.5410886","DOIUrl":null,"url":null,"abstract":"This article firstly, presents an analytical static model of Single Electron Transistor (SET) based on the orthodox theory and enhanced to take into account the influence of temperature (thermionic current). Comparisons with the SIMON simulator and measurements show that our model is correct and accurate. Using this model, we analysed the performances of Voltage Controlled Oscillators (VCO) based on two hybrid SET-MOSFET architectures. In particular we compared the VCO performances with ideal and realistic SETs for different CMOS technology nodes.","PeriodicalId":343974,"journal":{"name":"2009 16th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2009)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 16th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2009)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICECS.2009.5410886","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This article firstly, presents an analytical static model of Single Electron Transistor (SET) based on the orthodox theory and enhanced to take into account the influence of temperature (thermionic current). Comparisons with the SIMON simulator and measurements show that our model is correct and accurate. Using this model, we analysed the performances of Voltage Controlled Oscillators (VCO) based on two hybrid SET-MOSFET architectures. In particular we compared the VCO performances with ideal and realistic SETs for different CMOS technology nodes.