Investigation of off-board DPI method

Abstract

An off-board direct RF power injection (DPI) method using a probe is proposed to investigate the IC immunity. The details of the measurement setup are outlined in this works. We also reviewed the conventional DPI method in addition to a discussion on the limitation of the test printed circuit board. The 3 dB bandwidth of this proposed probe is confirmed. A low dropout regulator (LDO) is used to compare the performance of the on-board injection network and the proposed scheme. The experimental result shows that the maximum deviation of the immunity level is less than 1 dB between the conventional and the proposed method.