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Characterization of a MEMS-Based Embedded Non Volatile Memory Array for Extreme Environments

2011 3rd IEEE International Memory Workshop (IMW) Pub Date : 2011-05-22 DOI:10.1109/IMW.2011.5873214
C. Zambelli, P. Olivo, R. Gaddi, C. Schepens, Charles Smith
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引用次数: 5

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极端环境下基于mems的嵌入式非易失性存储器阵列的特性研究
本文章由计算机程序翻译，如有差异，请以英文原文为准。
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2011 3rd IEEE International Memory Workshop (IMW)
2011 3rd IEEE International Memory Workshop (IMW)
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