Deep sub-micron I/sub DDQ/ testing: issues and solutions

Abstract

The effectiveness of I/sub DDQ/ testing in deep sub-micron is threatened by the increased transistor sub-threshold leakage current. In this article, we survey possible solutions and propose a deep sub-micron I/sub DDQ/ test mode. The methodology provides means for unambiguous measurements of I/sub DDQ/ components and defect diagnosis. The effectiveness of the test mode is demonstrated with a real life example.