{"title":"A bipartite graph approach to generate optimal test sequences for protocol conformance testing using the Wp-method","authors":"Jun Wang, Jitian Xiao, C. Lam, Huaizhong Li","doi":"10.1109/APSEC.2005.5","DOIUrl":null,"url":null,"abstract":"Conformance testing using test sequences is used to ensure that a protocol implementation conforms to its specification. A commonly used technique to generate test sequences for specifications described by the finite state machines is the Wp-method with the reset technique, which frequently results in long test sequences. In this paper, we propose a bipartite graph approach to generate optimal test sequences for protocol conformance testing. Our approach significantly reduces the length of the test sequences required for conformance testing while maintaining the same fault detection capability.","PeriodicalId":359862,"journal":{"name":"12th Asia-Pacific Software Engineering Conference (APSEC'05)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-12-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"12th Asia-Pacific Software Engineering Conference (APSEC'05)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APSEC.2005.5","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
Conformance testing using test sequences is used to ensure that a protocol implementation conforms to its specification. A commonly used technique to generate test sequences for specifications described by the finite state machines is the Wp-method with the reset technique, which frequently results in long test sequences. In this paper, we propose a bipartite graph approach to generate optimal test sequences for protocol conformance testing. Our approach significantly reduces the length of the test sequences required for conformance testing while maintaining the same fault detection capability.