{"title":"Modeling of passive-active device interactions","authors":"W. Schoenmaker, P. Meuris, W. Schilders, D. Ioan","doi":"10.1109/ESSDERC.2007.4430904","DOIUrl":null,"url":null,"abstract":"This paper deals with the modeling of the injection of electromagnetic fields into the active devices/circuits originating from integrated passive devices. It is shown that the impact of induced electromagnetic fields can be included as modified terminal conditions of the nearby devices.","PeriodicalId":103959,"journal":{"name":"ESSDERC 2007 - 37th European Solid State Device Research Conference","volume":"90 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ESSDERC 2007 - 37th European Solid State Device Research Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSDERC.2007.4430904","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
This paper deals with the modeling of the injection of electromagnetic fields into the active devices/circuits originating from integrated passive devices. It is shown that the impact of induced electromagnetic fields can be included as modified terminal conditions of the nearby devices.