Multiphysics Characterizations of Vertical GaN Schottky Diodes

Atse Julien Eric N'Dohi, C. Sonneville, Soufiane Saidi, T. Ngo, P. de Mierry, É. Frayssinet, Y. Cordier, L. Phung, F. Morancho, K. Isoird, J. Tasselli, H. Maher, D. Planson
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Abstract

In this work, measurements from cathodo-luminescence (CL), micro-Raman spectroscopy and current-voltage I (V) have been coupled to assess the effects of physical parameters such as threading dislocations and effective doping level homogeneity on the electrical performances of vertical GaN Schottky diodes.
垂直GaN肖特基二极管的多物理场特性
在这项工作中,阴极发光(CL),微拉曼光谱和电流电压I (V)的测量相结合,以评估物理参数,如螺纹位错和有效掺杂水平均匀性对垂直GaN肖特基二极管电性能的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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