A System for Simultaneous Application of Uniaxial Strain and Electric Field to the Crystal Sample in Wide Temperature Range for X-Ray Scattering Experiments

Abstract

The sample cell for the single crystal X-ray diffraction measurements under simultaneous application of the controllable uniaxial tensile strain and electric field in a wide temperature range is described. The details of the cell design are discussed. Test diffraction measurements were performed with 0.67PbMg1/3Nb2/3O3-0.33PbTiO3 (0.67PMN-0.33PT) single crystal. The sample had platelet shape thinned in central part. Here we present experimental results, acquired with a new system.