Construction of High-Rate Generalized Concatenated Codes for Applications in Non-Volatile Flash Memories

Abstract

This work proposes a construction for high-rate generalized concatenated (GC) codes. The proposed codes are well suited for error correction in flash memories for high reliability data storage. The GC codes are constructed from inner nested binary Bose-Chaudhuri-Hocquenghem (BCH) codes and outer Reed-Solomon (RS) codes. For the inner codes we propose extended BCH codes, where we apply single parity-check codes in the first level of the GC code. This enables high-rate codes.