Data-retention time prediction of long-term archive SSD with flexible-nLC NAND flash

Abstract

This paper proposes a new method to predict the data-retention time of long-term archive SSD with flexible-nLC NAND flash. This paper first reports that the conventional prediction overestimates the data lifetime based on the long-term data retention measurement. Then, a more precise prediction is proposed. By using this proposal, the most reliable and lowest cost memory architecture is determined. As a result, over 100-year data-retention is achieved, which is 25-times longer than the conventional TLC NAND flash memory.