S. Matsuyama, J. Yamada, T. Hagiwara, K. Omote, Raita Hirose, Y. Takeda, Y. Kohmura, M. Yabashi, T. Ishikawa, K. Yamauchi
{"title":"Development of high-resolution full-field x-ray microscope based on multilayer advanced Kirkpatrick-Baez mirrors (Conference Presentation)","authors":"S. Matsuyama, J. Yamada, T. Hagiwara, K. Omote, Raita Hirose, Y. Takeda, Y. Kohmura, M. Yabashi, T. Ishikawa, K. Yamauchi","doi":"10.1117/12.2528366","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":128745,"journal":{"name":"X-Ray Nanoimaging: Instruments and Methods IV","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-09-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"X-Ray Nanoimaging: Instruments and Methods IV","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2528366","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}