{"title":"Modelling the annealing of poly-Si/SiOx/c-Si junctions","authors":"N. Folchert, S. Bordihn, R. Peibst, R. Brendel","doi":"10.1063/5.0089597","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":403678,"journal":{"name":"SiliconPV 2021, The 11th International Conference on Crystalline Silicon Photovoltaics","volume":"116 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"SiliconPV 2021, The 11th International Conference on Crystalline Silicon Photovoltaics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1063/5.0089597","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}