Nanostructural Investigations of Optical Materials and Devices Surfaces by Means of Scanning Probe Microscopy

2006 International Workshop on Laser and Fiber-Optical Networks Modeling Pub Date : 2006-12-04 DOI:10.1109/LFNM.2006.252062

M. Ihnatouski, A. Sviridenok

引用次数: 0

Abstract

The optical material's and device's surfaces have been investigated by means of scanning probe microscopy. As a result of researches the techniques of measurement, the analysis of a surface of optical glasses, fiber-optical systems and laser elements have been developed

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利用扫描探针显微镜研究光学材料和器件表面的纳米结构

用扫描探针显微镜对光学材料和器件的表面进行了研究。由于测量技术的研究，光学玻璃、光纤光学系统和激光元件的表面分析得到了发展

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2006 International Workshop on Laser and Fiber-Optical Networks Modeling

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