Robust process capability index tracking for process qualification

Cong Gu, C. McAndrew
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Abstract

This paper presents a robust process qualification and monitoring procedure based on the recently developed YAT and YWL process capability indices. Combined with appropriate test structures and measurements the procedure enables rapid process maturity evaluation and on-going loop closure of manufacturing to process specifications. The procedure generates interactive web-based reports and data that provide high-level “scoring” and a time-line of process capability, an ability to quickly dive down and identify the root cause of issues, and capability to compare between fabs.
稳健的过程能力指数跟踪过程确认
本文提出了一种基于新开发的YAT和YWL过程能力指标的鲁棒过程确认和监控程序。与适当的测试结构和测量相结合,该程序可以实现快速的工艺成熟度评估和制造工艺规范的持续闭环。该程序生成交互式的基于网络的报告和数据,提供高级的“评分”和过程能力的时间线,快速深入并确定问题的根本原因的能力,以及在晶圆厂之间进行比较的能力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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